A less expensive option to high-volume gate array designs is applied to EPF6016TC144-8. The OptiFLEX design, which is the foundation of FLEX 6000 devices, reduces die size while preserving great performance and routability. The devices' programmable SRAM components provide designers the freedom to swiftly alter their designs during design testing and prototyping. Through in-circuit reconfiguration, designers can also alter functionality while a device is operating.
This EPF6016TC144-8 is 100% tested before shipping and are reprogrammable. As a result, designers can concentrate on simulation and design verification as they are not obliged to produce test vectors for fault coverage purposes. Additionally, the inventor of various gate array designs need not maintain inventories. On the board, EPF6016TC144-8 is set up for the particular functionality needed.
| Specification | Value |
|---|---|
| Series | FLEX 6000 |
| Number of Logic Blocks | 132 |
| Number of I/Os | 81 |
| Operating Supply Voltage | 3.3 V |
| Maximum Operating Temperature | + 70 C |
| Mounting Style | SMD/SMT |
| Package / Case | FBGA-100 |
| Minimum Operating Temperature | 0 C |
| Operating Supply Current | 5 mA |
| Packaging | Tray |
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